Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12314355 | Information processing system, device, and authentication method | — | 2025-05-27 |
| 11626266 | Charged particle beam device | Kenji Tanimoto, Yusuke Abe, Takuma Yamamoto, Kei Sakai, Satoru Yamaguchi +2 more | 2023-04-11 |
| 11394844 | Authentication system, shared terminal, and authentication method | Xiaofeng Han, Shikou Miyamoto | 2022-07-19 |
| 11276548 | Charged particle beam device and charged particle beam adjustment method | Hitomi Sakai, Daisuke Sato, Hiroyuki Saito, Kazuma Tanii | 2022-03-15 |
| 10546017 | Displaying terms having corresponding character strings on a display | Kazuki Sasayama, Tatsuma Hirokawa, Zentaroh Ono | 2020-01-28 |
| 10416940 | Image processing apparatus, image processing system, and image processing method for interpreting content obtained from a web browser and displaying a screen based on the interpreted content | Hiroki Asakimori, Tomohiro KUROYANAGI, Yuuta Saitoh, Nobuya MONDEN, Yohsuke Utoh | 2019-09-17 |
| 9200896 | Pattern dimension measurement method and charged particle beam microscope used in same | Yoshinori Nakayama, Junichi Tanaka | 2015-12-01 |
| 9110384 | Scanning electron microscope | Seiko Omori, Junichi Tanaka, Yoshinori Nakayama | 2015-08-18 |
| 8637820 | Scanning electron microscope and inspection method using same | Yasunari Sohda, Takeyoshi Ohashi, Kaori Shirahata | 2014-01-28 |
| 8478021 | Charged beam device | Kaori Shirahata, Yoshinori Nakayama, Muneyuki Fukuda, Yasunari Sohda | 2013-07-02 |
| 8263929 | Standard member for correction, scanning electron microscope using same, and scanning electron microscope correction method | Yoshinori Nakayama, Yasunari Sohda | 2012-09-11 |
| 7875850 | Standard component for calibration and electron-beam system using the same | Yoshinori Nakayama, Yasunari Sohda | 2011-01-25 |
| 7750296 | Scanning electron microscope and calibration of image distortion | Yasunari Sohda, Yoshinori Nakayama, Hajime Koyanagi | 2010-07-06 |
| 7683313 | Charged particle beam measurement equipment, size correction and standard sample for correction | Yasunari Sohda, Yoshinori Nakayama, Hajime Koyanagi | 2010-03-23 |
| 7612334 | Standard reference component for calibration, fabrication method for the same, and scanning electron microscope using the same | Yoshinori Nakayama, Yasunari Sohda, Hajime Koyanagi | 2009-11-03 |