Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9110384 | Scanning electron microscope | Junichi Tanaka, Yoshinori Nakayama, Keiichiro Hitomi | 2015-08-18 |
| 8309923 | Sample observing method and scanning electron microscope | Zhaohui Cheng, Hideyuki Kazumi | 2012-11-13 |
| 7928384 | Localized static charge distribution precision measurement method and device | Zhaohui Cheng, Tasuku Yano | 2011-04-19 |