Issued Patents All Time
Showing 26–50 of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7005651 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Kaoru Umemura | 2006-02-28 |
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2005-11-01 |
| 6839200 | Combination perpendicular magnetic head having shield material formed at both ends of an upper pole of a write element | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2005-01-04 |
| 6822245 | Ion beam apparatus and sample processing method | Hiroyuki Muto, Yuichi Madokoro | 2004-11-23 |
| 6794663 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2004-09-21 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Hidemi Koike, Aritoshi Sugimoto, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |
| 6665141 | Magnetic head having track width defined by trench portions filled with magnetic shield material | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2003-12-16 |
| 6664552 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2003-12-16 |
| 6627889 | Apparatus and method for observing sample using electron beam | Isao Ochiai, Hidemi Koike, Satoshi Tomimatsu, Muneyuki Fukuda, Mitsugu Sato | 2003-09-30 |
| 6538844 | Method of fabricating a magnetic head by focused ion beam etching | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2003-03-25 |
| 6521890 | Focused ion beam machining method and focused ion beam machining apparatus | Tsuyoshi Ohnishi, Megumi Aizawa, Hiroji Iwata | 2003-02-18 |
| 6310341 | Projecting type charged particle microscope and projecting type substrate inspection system | Hideo Todokoro, Yasutsugu Usami, Shunroku Taya, Hiroyuki Shinada, Taku Ninomiya +1 more | 2001-10-30 |
| 6307707 | Narrow track thin film head including magnetic poles machined by focused ion beam etching | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2001-10-23 |
| 6278578 | Narrow track thin film head having a focused ion beam etched air bearing surface | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2001-08-21 |
| 6111723 | Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 2000-08-29 |
| 5852297 | Focused ion beam apparatus and method for irradiating focused ion beam | Tsuyoshi Ohnishi | 1998-12-22 |
| 5850326 | Narrow track thin film magnetic head suitable for high density recording and reproducing operations and fabrication method thereof wherein an air bearing surface has at least one groove containing a non-magnetic electrically conductive layer | Hisashi Takano, Naoki Koyama, Hideo Tanabe, Eijin Moriwaki, Isamu Yuito +5 more | 1998-12-15 |
| 5656811 | Method for making specimen and apparatus thereof | Fumikazu Itoh, Toshihiko Nakata, Akira Shimase, Hiroshi Yamaguchi, Takashi Kamimura | 1997-08-12 |
| 5495110 | Observation method and apparatus for removing an oxidation layer and forming an image from a sample | Tsuyoshi Ohnishi | 1996-02-27 |
| 5399865 | Liquid metal ion source with high temperature cleaning apparatus for cleaning the emitter and reservoir | Kaoru Umemura | 1995-03-21 |
| 5270552 | Method for separating specimen and method for analyzing the specimen separated by the specimen separating method | Tsuyoshi Ohnishi | 1993-12-14 |
| 5198672 | Signal generator and method of generating signal voltages using the same | Tsuyoshi Ohnishi, Moritoshi Yasunaga | 1993-03-30 |
| 5148027 | Method of microarea analysis with a focused cesium ion beam | Kaoru Umemura, Hiroyasu Schichi | 1992-09-15 |
| 5120925 | Methods for device transplantation | Tsuyoshi Ohnishi, Yoshimi Kawanami, Yuuichi Madokoro, Kaoru Umemura | 1992-06-09 |