Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11199480 | Thin-sample-piece fabricating device and thin-sample-piece fabricating method | — | 2021-12-14 |
| 11094503 | Method of preparing thin film sample piece and charged particle beam apparatus | Masato Suzuki, Satoshi Tomimatsu, Makoto Sato | 2021-08-17 |
| 9595420 | Method for preparing lamella | — | 2017-03-14 |
| 9455119 | Charged particle beam apparatus | Makoto Sato, Tatsuya Asahata, Masahiro Kiyohara | 2016-09-27 |
| 9315898 | TEM sample preparation method | Hidekazu Suzuki | 2016-04-19 |
| 9310325 | Focused ion beam apparatus and method of working sample using the same | Makoto Sato | 2016-04-12 |
| 9260782 | Sample preparation method | Xin Man | 2016-02-16 |
| 8198603 | Sample preparing device and sample posture shifting method | Haruo Takahashi, Junichi Tashiro | 2012-06-12 |