HT

Haruo Takahashi

SN Sii Nanotechnology: 8 patents #15 of 157Top 10%
HS Hitachi High-Tech Science: 4 patents #39 of 167Top 25%
SI Seiko Instruments: 3 patents #474 of 1,437Top 35%
MC Murata Manufacturing Co.: 3 patents #2,166 of 5,295Top 45%
SA Sanden: 2 patents #221 of 631Top 40%
UL Ulvac: 2 patents #199 of 680Top 30%
SC Sankyo Electric Co.: 1 patents #6 of 15Top 40%
NE Nec: 1 patents #7,889 of 14,502Top 55%
BL Bridgestone Tire Company Limited: 1 patents #196 of 438Top 45%
TO Toshiba: 1 patents #1,121 of 2,688Top 45%
TE Tokyo Shibaura Electric: 1 patents #96 of 337Top 30%
Overall (All Time): #145,558 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 1–25 of 27 patents

Patent #TitleCo-InventorsDate
10989674 X-ray inspection apparatus and x-ray inspection method Masaki Tatsumi, Isao Yagi 2021-04-27
9721749 X-ray generator and fluorescent X-ray analyzer Ryusuke Hirose 2017-08-01
9612214 X-ray fluorescence analyzer Ryusuke Hirose, Isao Yagi, Toshiyuki Takahara 2017-04-04
9410906 X-ray fluorescence spectrometer comprising a temperature sensor, two external-air fans, and a circulation fan Ryusuke Hirose, Yoshiki Matoba, Koichi Tamura 2016-08-09
8642958 Composite charged particle beam apparatus and sample processing and observing method Masakatsu Hasuda 2014-02-04
8542275 Method and apparatus for cross-section processing and observation Masahiro Kiyohara, Makoto Sato, Junichi Tashiro 2013-09-24
8198603 Sample preparing device and sample posture shifting method Ikuko Nakatani, Junichi Tashiro 2012-06-12
7973280 Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same Yutaka Ikku, Yo Yamamoto, Kouji Iwasaki 2011-07-05
7927472 Optical film thickness controlling method, optical film thickness controlling apparatus, dielectric multilayer film manufacturing apparatus, and dielectric multilayer film manufactured using the same controlling apparatus or manufacturing apparatus Kouichi Hanzawa, Takafumi Matsumoto 2011-04-19
7755044 Apparatus for working and observing samples and method of working and observing cross sections Toshiaki Fujii, Junichi Tashiro 2010-07-13
7718981 Composite charged-particle beam system Yo Yamamoto, Toshiaki Fujii 2010-05-18
7518125 Processing apparatus using focused charged particle beam Yo Yamamoto, Toshiaki Fujii 2009-04-14
7442942 Charged particle beam apparatus Toshiaki Fujii, Yutaka Ikku, Kouji Iwasaki, Yo Yamamoto 2008-10-28
7247345 Optical film thickness controlling method and apparatus, dielectric multilayer film and manufacturing apparatus thereof Kouichi Hanzawa, Takafumi Matsumoto 2007-07-24
6563902 Energy dispersive X-ray analyzer 2003-05-13
6288504 Deflection current/high voltage integration type power supply Nobuaki Imamura 2001-09-11
6154517 Fluorescent X-ray spectroscope 2000-11-28
6005435 High-voltage generating circuit Yasunobu Saida, Nobuaki Imamura, Yasuhiko Toda, Masaru Omura, Hisashi Takiguchi 1999-12-21
5883794 High voltage generating circuit including high voltage circuit section having voltage dividing resistor and speed-up capacitor Nobuaki Imamura, Yasuhiko Toda, Yasunobu Saida, Hisashi Takiguchi, Masaru Omura 1999-03-16
5506920 Optical wavelength tunable filter Yoshihiko Suemura, Naoya Henmi, Akio Tajima, Hiroyuki Morimura 1996-04-09
5425066 Method of finding the center of a band-shaped region Kiyoshi Hasegawa 1995-06-13
4502844 Refrigerant compressor with mechanism for adjusting capacity of the compressor Shogo Kimura 1985-03-05
4444549 Refrigerant compressor Shogo Kimura 1984-04-24
4309652 Current transforming circuits Teruhiko Ito 1982-01-05
4283997 Refrigerant compressors Shougo Kimura 1981-08-18