Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906899 | Mask defect repair apparatus and mask defect repair method | Yoshitomo Nakagawa, Mitsuto Aso, Katsumi Suzuki, Mamoru Okabe | 2024-02-20 |
| 10468228 | Charged particle beam apparatus | — | 2019-11-05 |
| 9885639 | Sample carrying device and vacuum apparatus | Toshiyuki Iwahori | 2018-02-06 |
| 8674324 | Charged particle beam apparatus and sample transporting apparatus | — | 2014-03-18 |
| 8664598 | Electron microscope and specimen analyzing method | Atsushi Uemoto, Toshiaki Fujii, Junichi Tashiro | 2014-03-04 |
| 8642958 | Composite charged particle beam apparatus and sample processing and observing method | Haruo Takahashi | 2014-02-04 |
| 7574932 | Sample holding mechanism and sample working/observing apparatus | Mamoru Okabe | 2009-08-18 |
| 7500779 | Thermal analysis apparatus | Toshitada Takeuchi | 2009-03-10 |
| 7297944 | Ion beam device and ion beam processing method, and holder member | Toshio Kodama, Toshiaki FUJI, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi | 2007-11-20 |
| 7276691 | Ion beam device and ion beam processing method | Toshio Kodama, Toshiaki Fujii, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi | 2007-10-02 |
| 6838685 | Ion beam apparatus, ion beam processing method and sample holder member | Toshio Kodama, Toshiaki Fujii, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi | 2005-01-04 |