Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8657962 | Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus | Hiroki Hayashi, Takashi Konno, Masatoshi Yasutake, Junichi Tashiro | 2014-02-25 |
| 8581206 | Focused ion beam system and sample processing method using the same | Xin Man, Junichi Tashiro | 2013-11-12 |
| 8304721 | Micro cross-section processing method | Tatsuya Adachi | 2012-11-06 |
| 8269194 | Composite focused ion beam device, and processing observation method and processing method using the same | Takashi Kaito, Junichi Tashiro, Yasuhiko Sugiyama, Toshiaki Fujii, Kazuo Aita +1 more | 2012-09-18 |
| 8191168 | Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope | Xin Man, Tatsuya Asahata | 2012-05-29 |
| 7973280 | Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same | Haruo Takahashi, Yutaka Ikku, Yo Yamamoto | 2011-07-05 |
| 7736893 | Nanobio device of imitative anatomy structure | Masanao Munekane, Hiroyuki Wada, Toshiaki Fujii, Takahiro Ochiya, Yusuke Yamamoto +1 more | 2010-06-15 |
| 7626165 | Focused ion beam apparatus and method of preparing/observing sample | — | 2009-12-01 |
| 7442942 | Charged particle beam apparatus | Haruo Takahashi, Toshiaki Fujii, Yutaka Ikku, Yo Yamamoto | 2008-10-28 |
| 7404339 | Probe and small sample pick up mechanism | Masanao Munekane, Takashi Konno, Hiroki Hayashi | 2008-07-29 |
| 7345289 | Sample support prepared by semiconductor silicon process technique | Masanso Munekane | 2008-03-18 |
| 7297944 | Ion beam device and ion beam processing method, and holder member | Toshio Kodama, Masakatsu Hasuda, Toshiaki FUJI, Yasuhiko Sugiyama, Yasuyuki Takagi | 2007-11-20 |
| 7276691 | Ion beam device and ion beam processing method | Toshio Kodama, Masakatsu Hasuda, Toshiaki Fujii, Yasuhiko Sugiyama, Yasuyuki Takagi | 2007-10-02 |
| 7267731 | Method and system for fabricating three-dimensional microstructure | — | 2007-09-11 |
| D545693 | Clock | — | 2007-07-03 |
| 7067823 | Micro-sample pick-up apparatus and micro-sample pick-up method | Yo Yamamoto | 2006-06-27 |
| 7060397 | EPL mask processing method and device thereof | Yo Yamamoto, Masamichi Oi | 2006-06-13 |
| 7002150 | Thin specimen producing method and apparatus | Yutaka Ikku | 2006-02-21 |
| 6838685 | Ion beam apparatus, ion beam processing method and sample holder member | Toshio Kodama, Masakatsu Hasuda, Toshiaki Fujii, Yasuhiko Sugiyama, Yasuyuki Takagi | 2005-01-04 |
| 6593583 | Ion beam processing position correction method | — | 2003-07-15 |
| 6395347 | Micromachining method for workpiece observation | Tatsuya Adachi, Takashi Kaito, Yoshihiro Koyama | 2002-05-28 |