Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11600463 | Cross-section observation device, and control method | Junzo Azuma | 2023-03-07 |
| 11424100 | Charged particle beam irradiation apparatus and control method | Takuma Aso, Makoto Sato, Tatsuya Asahata | 2022-08-23 |
| 11335534 | Particle beam irradiation apparatus | Takuma Aso, Makoto Sato, Tatsuya Asahata | 2022-05-17 |
| 11114276 | Apparatus, method, and program for processing and observing cross section, and method of measuring shape | Tatsuya Asahata, Makoto Sato | 2021-09-07 |
| 10692695 | Cross section processing observation method and charged particle beam apparatus | — | 2020-06-23 |
| 10242842 | Method for cross-section processing and observation and apparatus therefor | Atsushi Uemoto | 2019-03-26 |
| 10096449 | Cross-section processing-and-observation method and cross-section processing-and-observation apparatus | Tatsuya Asahata, Atsushi Uemoto | 2018-10-09 |
| 9966226 | Cross-section processing and observation method and cross-section processing and observation apparatus | Atsushi Uemoto, Tatsuya Asahata | 2018-05-08 |
| 9934938 | Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium | Atsushi Uemoto, Tatsuya Asahata | 2018-04-03 |
| 9470642 | Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method | Toshiaki Fujii | 2016-10-18 |
| 9384941 | Charged particle beam apparatus and sample observation method | — | 2016-07-05 |
| 9368323 | Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus | Atsushi Uemoto, Tatsuya Asahata | 2016-06-14 |
| 9347896 | Cross-section processing-and-observation method and cross-section processing-and-observation apparatus | Tatsuya Asahata, Atsushi Uemoto | 2016-05-24 |
| 9318303 | Charged particle beam apparatus | Tatsuya Asahata, Atsushi Uemoto | 2016-04-19 |
| 9287087 | Sample observation method, sample preparation method, and charged particle beam apparatus | Atsushi Uemoto | 2016-03-15 |
| 9260782 | Sample preparation method | Ikuko Nakatani | 2016-02-16 |
| 9245713 | Charged particle beam apparatus | Tatsuya Asahata, Atsushi Uemoto | 2016-01-26 |
| 9214316 | Composite charged particle beam apparatus | Yo Yamamoto, Tatsuya Asahata | 2015-12-15 |
| 9202671 | Charged particle beam apparatus and sample processing method using charged particle beam apparatus | Atsushi Uemoto, Tatsuya Asahata | 2015-12-01 |
| 9080945 | Cross-section processing and observation method and cross-section processing and observation apparatus | Atsushi Uemoto, Tatsuya Asahata | 2015-07-14 |
| 9046472 | Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method | Toshiaki Fujii | 2015-06-02 |
| 8853629 | Cross-section processing and observation method and cross-section processing and observation apparatus | — | 2014-10-07 |
| 8803111 | Sample preparation apparatus and sample preparation method | — | 2014-08-12 |
| 8642980 | Composite charged particle beam apparatus | Yo Yamamoto, Atsushi Uemoto, Tatsuya Asahata | 2014-02-04 |
| 8581206 | Focused ion beam system and sample processing method using the same | Kouji Iwasaki, Junichi Tashiro | 2013-11-12 |