Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835438 | Automatic sample preparation apparatus | Atsushi Uemoto, Tatsuya Asahata, Makoto Sato | 2023-12-05 |
| 11073453 | Automatic sample preparation apparatus and automatic sample preparation method | Atsushi Uemoto, Tatsuya Asahata, Makoto Sato | 2021-07-27 |
| 10677697 | Automatic sample preparation apparatus | Atsushi Uemoto, Tatsuya Asahata, Makoto Sato | 2020-06-09 |
| 10622187 | Charged particle beam apparatus and sample processing observation method | Shota Torikawa, Hidekazu Suzuki, Hiroyuki Suzuki, Mamoru Okabe, Tatsuya Asahata | 2020-04-14 |
| 10236159 | Charged particle beam apparatus | Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata | 2019-03-19 |
| 10088401 | Automatic sample preparation apparatus | Atsushi Uemoto, Tatsuya Asahata, Makoto Sato | 2018-10-02 |
| 9620333 | Charged particle beam apparatus | Satoshi Tomimatsu, Makoto Sato, Atsushi Uemoto, Tatsuya Asahata | 2017-04-11 |
| 9275827 | Charged particle beam apparatus having needle probe that tracks target position changes | Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki | 2016-03-01 |
| 9218937 | Charged particle beam apparatus having improved needle movement control | Atsushi Uemoto, Tatsuya Asahata, Hidekazu Suzuki | 2015-12-22 |
| 9214316 | Composite charged particle beam apparatus | Xin Man, Tatsuya Asahata | 2015-12-15 |
| 9024280 | Composite charged particle beam apparatus | Atsushi Uemoto, Tatsuya Asahata | 2015-05-05 |
| 8698105 | Charged particle beam apparatus and method of adjusting charged particle optics | Takashi Ogawa, Hiroshi Matsumura | 2014-04-15 |
| 8642980 | Composite charged particle beam apparatus | Xin Man, Atsushi Uemoto, Tatsuya Asahata | 2014-02-04 |
| 8558045 | Catalyst for aromatization of lower hydrocarbons and process for production of aromatic compounds | Shinichi Yamada, Tomohiro Yamada, Yuji Ogawa, Takuya Hatagishi, Yoshio Sugiyama | 2013-10-15 |
| 8274049 | Sample processing and observing method | Keiichi Tanaka, Xin Man, Junichi Tashiro, Toshiaki Fujii | 2012-09-25 |
| 8124932 | Charged particle beam apparatus and method adjusting axis of aperture | Takashi Ogawa, Hiroshi Matsumura | 2012-02-28 |
| 7973280 | Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same | Haruo Takahashi, Yutaka Ikku, Kouji Iwasaki | 2011-07-05 |
| 7718981 | Composite charged-particle beam system | Haruo Takahashi, Toshiaki Fujii | 2010-05-18 |
| 7518125 | Processing apparatus using focused charged particle beam | Haruo Takahashi, Toshiaki Fujii | 2009-04-14 |
| 7442942 | Charged particle beam apparatus | Haruo Takahashi, Toshiaki Fujii, Yutaka Ikku, Kouji Iwasaki | 2008-10-28 |
| 7067823 | Micro-sample pick-up apparatus and micro-sample pick-up method | Kouji Iwasaki | 2006-06-27 |
| 7060397 | EPL mask processing method and device thereof | Kouji Iwasaki, Masamichi Oi | 2006-06-13 |
| 5710920 | Object extending method | Takeo Maruyama, Satoshi Wakayama | 1998-01-20 |