Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7339383 | Nanogripper device having length measuring function and method for length measurement executed with nanogripper device having length measuring function | Takashi Konno, Hiroki Hayashi, Toshihide Tani, Masanao Munekane, Koji Iwasaki | 2008-03-04 |
| 7154106 | Composite system of scanning electron microscope and focused ion beam | Takashi Ogawa | 2006-12-26 |
| 7060397 | EPL mask processing method and device thereof | Yo Yamamoto, Kouji Iwasaki | 2006-06-13 |
| 6934920 | Specimen analyzing method | Toshiaki Fujii, Atsushi Yamauchi | 2005-08-23 |
| 6825468 | Fine stencil structure correction device | Tatsuya Asahata | 2004-11-30 |
| 6486471 | Composite charge particle beam apparatus | — | 2002-11-26 |
| 6472881 | Liquid metal ion source and method for measuring flow impedance of liquid metal ion source | Yasuhiko Sugiyama | 2002-10-29 |
| 6452172 | Composite charged particle beam apparatus | — | 2002-09-17 |
| 6452173 | Charged particle apparatus | — | 2002-09-17 |