TF

Toshiaki Fujii

SN Sii Nanotechnology: 19 patents #2 of 157Top 2%
EC Ebara Research Co.: 10 patents #1 of 45Top 3%
SI Seiko Instruments: 9 patents #182 of 1,437Top 15%
EB Ebara: 9 patents #259 of 1,611Top 20%
HS Hitachi High-Tech Science: 3 patents #52 of 167Top 35%
Honda Motor Co.: 3 patents #6,619 of 21,052Top 35%
NE Nec: 2 patents #5,510 of 14,502Top 40%
JI Japan Atomic Energy Research Institute: 2 patents #81 of 609Top 15%
NU National University Corporation Nagoya University: 2 patents #92 of 782Top 15%
NT NTT: 2 patents #2,095 of 4,871Top 45%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
HA Honda Patents & Technologies North America: 1 patents #24 of 46Top 55%
JE Jeol: 1 patents #309 of 669Top 50%
RO Rorze: 1 patents #21 of 44Top 50%
CH Cci Holdings: 1 patents #11 of 37Top 30%
Overall (All Time): #35,766 of 4,157,543Top 1%
63
Patents All Time

Issued Patents All Time

Showing 1–25 of 63 patents

Patent #TitleCo-InventorsDate
11588168 Separator for fuel cell or current collecting member for fuel cell, and solid polymer electrolyte fuel cell Yasuo Suzuki, Masanori Watanabe 2023-02-21
10693169 Separator for fuel cell or current collecting member for fuel cell, and manufacturing method thereof Yasuo Suzuki, Masanori Watanabe 2020-06-23
9919473 Method for producing fiber-reinforced resin bonded body Daiya Yamashita, Hiroshi Kato, Satoshi Miyazu 2018-03-20
9679743 Sample processing evaluation apparatus Hiroyuki Suzuki 2017-06-13
9470642 Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method Xin Man 2016-10-18
9314990 Resin composite structure and method for producing the same Keiichi Sato, Daiya Yamashita, Hiroshi Kato 2016-04-19
9297719 Flight control system loading test apparatus and method Pascal Brisson, Hiroshi Yamanouchi 2016-03-29
9046472 Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method Xin Man 2015-06-02
8703247 Cross section processing method and method of manufacturing cross section observation sample Hidekazu Suzuki, Mike Hassel-Shearer 2014-04-22
8664598 Electron microscope and specimen analyzing method Masakatsu Hasuda, Atsushi Uemoto, Junichi Tashiro 2014-03-04
8548064 Video encoding method and decoding method by using selected parallax for parallax compensation, apparatuses therefor, programs therefor, and storage media for storing the programs Masaki Kitahara, Hideaki Kimata, Shinya Shimizu, Kazuto Kamikura, Yoshiyuki Yashima +2 more 2013-10-01
8451894 Video encoding method and decoding method, apparatuses therefor, programs therefor, and storage media for storing the programs by using parallax compensation Masayuki Tanimoto, Kenji Yamamoto, Masaki Kitahara, Hideaki Kimata, Shinya Shimizu +2 more 2013-05-28
8348583 Container and loader for substrate Osamu Horita, Koji Ohyama, Toshiya Nakayama, Fumio Sakiya, Mineo Kinpara 2013-01-08
8306264 Section processing method and its apparatus Junichi Tashiro, Mike Hassel-Shearer 2012-11-06
8274049 Sample processing and observing method Keiichi Tanaka, Yo Yamamoto, Xin Man, Junichi Tashiro 2012-09-25
8274063 Composite focused ion beam device, process observation method using the same, and processing method Takashi Kaito, Yoshitomo Nakagawa, Junichi Tashiro, Yasuhiko Sugiyama, Kazuo Aita +1 more 2012-09-25
8269194 Composite focused ion beam device, and processing observation method and processing method using the same Takashi Kaito, Junichi Tashiro, Yasuhiko Sugiyama, Kouji Iwasaki, Kazuo Aita +1 more 2012-09-18
7755044 Apparatus for working and observing samples and method of working and observing cross sections Haruo Takahashi, Junichi Tashiro 2010-07-13
7736893 Nanobio device of imitative anatomy structure Masanao Munekane, Hiroyuki Wada, Kouji Iwasaki, Takahiro Ochiya, Yusuke Yamamoto +1 more 2010-06-15
7718981 Composite charged-particle beam system Haruo Takahashi, Yo Yamamoto 2010-05-18
7700367 Method of making lamina specimen 2010-04-20
7531796 Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods Junichi Tashiro, Yutaka Ikku 2009-05-12
7518125 Processing apparatus using focused charged particle beam Yo Yamamoto, Haruo Takahashi 2009-04-14
7442942 Charged particle beam apparatus Haruo Takahashi, Yutaka Ikku, Kouji Iwasaki, Yo Yamamoto 2008-10-28
7301159 Charged particle beam apparatus and method of forming electrodes having narrow gap therebetween by using the same Masao Abe, Kunji Shigeto, Minuru Kawamura, Alekber Yu Kasumov, Kazuhito Tsukagoshi +1 more 2007-11-27