Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10309903 | ICP emission spectrophotometer | — | 2019-06-04 |
| 9820370 | Heat transfer system for an inductively coupled plasma device | Yoshitomo Nakagawa | 2017-11-14 |
| 9349572 | Energy dispersive X-ray analyzer and method for energy dispersive X-ray analysis | — | 2016-05-24 |
| 8611493 | X-ray fluorescence analyzer and X-ray fluorescence analysis method | Kiyoshi Hasegawa, Hideki Takiguchi | 2013-12-17 |
| 7973280 | Composite charged particle beam apparatus, method of processing a sample and method of preparing a sample for a transmission electron microscope using the same | Haruo Takahashi, Yo Yamamoto, Kouji Iwasaki | 2011-07-05 |
| 7634054 | X-ray tube and X-ray analysis apparatus | Yoshiki Matoba | 2009-12-15 |
| 7627088 | X-ray tube and X-ray analysis apparatus | Yoshiki Matoba | 2009-12-01 |
| 7595488 | Method and apparatus for specifying working position on a sample and method of working the sample | Junichi Tashiro, Makoto Sato | 2009-09-29 |
| 7531796 | Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods | Junichi Tashiro, Toshiaki Fujii | 2009-05-12 |
| 7518109 | Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample | Tatsuya Asahata, Hidekazu Suzuki | 2009-04-14 |
| 7442942 | Charged particle beam apparatus | Haruo Takahashi, Toshiaki Fujii, Kouji Iwasaki, Yo Yamamoto | 2008-10-28 |
| 7436926 | Fluorescent X-ray analysis apparatus | Yoshiki Matoba, Takayuki Fukai, Masanori Takahashi | 2008-10-14 |
| 7423266 | Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus | Junichi Tashiro, Makoto Sato | 2008-09-09 |
| 7054506 | Pattern measuring method and measuring system using display microscope image | — | 2006-05-30 |
| 7002150 | Thin specimen producing method and apparatus | Kouji Iwasaki | 2006-02-21 |
| 6924481 | Scanning microscope with brightness control | Tetsuji Nishimura | 2005-08-02 |
| 6888149 | Focused ion beam apparatus | — | 2005-05-03 |
| 5525806 | Focused charged beam apparatus, and its processing and observation method | Koji Iwasaki, Tatsuya Adachi, Takashi Kaito | 1996-06-11 |