Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12186456 | Artificial bone and manufacturing method of artificial bone | Satoshi Hamaguchi, Tomoko DEGUCHI, Satoshi Sugimoto, Hideki Yoshikawa, Chieko Asamori | 2025-01-07 |
| 11950821 | Surgical tool for positioning a surgical device, surgical device and kit | Keitaro MATSUKAWA, Geert MAHIEU, Ralph MOBBS, Yuichiro Abe, Meinrad Fiechter +2 more | 2024-04-09 |
| 8728286 | Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same | — | 2014-05-20 |
| 8274063 | Composite focused ion beam device, process observation method using the same, and processing method | Yoshitomo Nakagawa, Junichi Tashiro, Yasuhiko Sugiyama, Toshiaki Fujii, Kazuo Aita +1 more | 2012-09-25 |
| 8269194 | Composite focused ion beam device, and processing observation method and processing method using the same | Junichi Tashiro, Yasuhiko Sugiyama, Kouji Iwasaki, Toshiaki Fujii, Kazuo Aita +1 more | 2012-09-18 |
| 7550723 | Atom probe apparatus and method for working sample preliminary for the same | — | 2009-06-23 |
| 7511289 | Working method utilizing irradiation of charged particle beam onto sample through passage in gas blowing nozzle | — | 2009-03-31 |
| 7476418 | Method for fabricating nanometer-scale structure | Masatoshi Yasutake, Yoshiharu Shirakawabe, Itaru Kitajima | 2009-01-13 |
| 7326445 | Method and apparatus for manufacturing ultra fine three-dimensional structure | — | 2008-02-05 |
| 7235783 | Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method | — | 2007-06-26 |
| 6864481 | Probe for scanning probe microscope | Masatoshi Yasutake, Tatsuya Adachi | 2005-03-08 |
| 6797952 | Scanning atom probe | Osamu Nishikawa, Takaya Yagyu | 2004-09-28 |
| 6740368 | Beam shaped film pattern formation method | — | 2004-05-25 |
| 6544897 | Method for forming a vertical edge submicron through-hole and a thin film sample with this kind of through-hole | — | 2003-04-08 |
| 6395347 | Micromachining method for workpiece observation | Tatsuya Adachi, Yoshihiro Koyama, Kouji Iwasaki | 2002-05-28 |
| 5525806 | Focused charged beam apparatus, and its processing and observation method | Koji Iwasaki, Tatsuya Adachi, Yutaka Ikku | 1996-06-11 |
| 5376883 | Analysis of integrated circuit operability using a focused ion beam | — | 1994-12-27 |
| 5071671 | Process for forming pattern films | Yoshitomo Nakagawa, Hisao Houjyo, Masahiro Yamamoto | 1991-12-10 |
| 5028780 | Preparation and observation method of micro-section | Tatsuya Adachi | 1991-07-02 |
| 5023453 | Apparatus for preparation and observation of a topographic section | Tatsuya Adachi | 1991-06-11 |
| 4950498 | Process for repairing pattern film | — | 1990-08-21 |
| 4930439 | Mask-repairing device | Mitsuyoshi Sato, Yoshitomo Nakagawa | 1990-06-05 |
| 4876112 | Process for forming metallic patterned film | Tatsuya Adachi | 1989-10-24 |
| 4874632 | Process for forming pattern film | Yoshitomo Nakagawa, Hisao Houjyo, Masahiro Yamamoto | 1989-10-17 |
| 4704526 | Apparatus of regulating shape of focused ion beams | Hideaki Kyogoku | 1987-11-03 |