Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8859279 | Cell detachment method | Amiko Nihei, Masatsugu Shigeno, Akira Inoue, Osamu Matsuzawa, Naoya Watanabe | 2014-10-14 |
| 7823470 | Cantilever and cantilever manufacturing method | Masatsugu Shigeno, Osamu Matsuzawa, Naoya Watanabe, Amiko Nihei, Akira Inoue +2 more | 2010-11-02 |
| 7494575 | Method for manufacturing a split probe | Shoji Sadayama, Kazutaka Takahashi | 2009-02-24 |
| 7476418 | Method for fabricating nanometer-scale structure | Masatoshi Yasutake, Takashi Kaito, Itaru Kitajima | 2009-01-13 |
| 7456400 | Scanning probe microscope and scanning method | Masatsugu Shigeno, Amiko Nihei, Osamu Matsuzawa, Naoya Watanabe, Akira Inoue | 2008-11-25 |
| 7398678 | Probe for a scanning microscope | Yoshikazu Nakayama, Takashi Okawa, Shigenobu Yamanaka, Akio Harada, Masatoshi Yasutake | 2008-07-15 |
| 7337656 | Surface characteristic analysis apparatus | Hiroshi Takahashi, Tadashi Arai | 2008-03-04 |
| 6953519 | Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus | Hiroshi Takahashi, Tadashi Arai | 2005-10-11 |
| 6941798 | Scanning probe microscope and operation method | Takehiro Yamaoka, Kazutoshi Watanabe, Kazunori Ando | 2005-09-13 |
| 6932504 | Heated self-detecting type cantilever for atomic force microscope | Hiroshi Takahashi, Tadashi Arai | 2005-08-23 |
| 6787769 | Conductive probe for scanning microscope and machining method using the same | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-09-07 |
| 6759653 | Probe for scanning microscope produced by focused ion beam machining | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-07-06 |
| 6705154 | Cantilever for vertical scanning microscope and probe for vertical scan microscope | Yoshikazu Nakayama, Seiji Akita, Akio Harada, Takashi Okawa, Yuichi Takano +1 more | 2004-03-16 |
| 6667467 | Microprobe and scanning probe apparatus having microprobe | Nobuhiro Shimizu, Hiroshi Takahashi, Jürgen Brugger, Walter Haberle, Gerd Binnig +1 more | 2003-12-23 |
| 6664540 | Microprobe and sample surface measuring apparatus | Nobuhiro Shimizu, Hiroshi Takahashi, Chiaki Yasumuro | 2003-12-16 |
| 6469293 | Multiprobe and scanning probe microscope | Nobuhiro Shimizu, Hiroshi Takahashi, Chiaki Yasumuro, Tadashi Arai | 2002-10-22 |
| 6422069 | Self-exciting and self-detecting probe and scanning probe apparatus | Nobuhiro Shimizu, Hiroshi Takahashi, Chiaki Yasumuro, Tadashi Arai | 2002-07-23 |
| 6405583 | Correlation sample for scanning probe microscope and method of processing the correlation sample | Hiroshi Takahashi, Nobuhiro Shimizu, Takehiro Yamaoka | 2002-06-18 |
| 6388252 | Self-detecting type of SPM probe and SPM device | Hiroshi Takahashi, Nobuhiro Shimizu, Michel Despont | 2002-05-14 |
| 6383823 | Probe for scanning probe microscope (SPM) and SPM device | Hiroshi Takahashi, Nobuhiro Shimizu | 2002-05-07 |
| 6294099 | Method of processing circular patterning | Hiroshi Takahashi, Susumu Ihcihara, Michel Despont | 2001-09-25 |
| 6211540 | Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensor | Hiroshi Takahashi, Nobuhiro Shimizu, Susumu Ichihara, Michel Despont | 2001-04-03 |
| 6171437 | Semiconductor manufacturing device | Nobuhiro Shimizu, Akira Inoue | 2001-01-09 |
| 6049115 | Scanning probe microscope, and semiconductor distortion sensor for use therein | Hiroshi Takahashi, Nobuhiro Shimizu | 2000-04-11 |
| 5992225 | Cantilever probe and scanning type probe microscope utilizing the cantilever probe | Nobuhiro Shimizu, Hiroshi Takahashi | 1999-11-30 |