AN

Amiko Nihei

SI Seiko Instruments: 2 patents #605 of 1,437Top 45%
HS Hitachi High-Tech Science: 1 patents #94 of 167Top 60%
SN Sii Nanotechnology: 1 patents #82 of 157Top 55%
Overall (All Time): #1,222,532 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
8859279 Cell detachment method Masatsugu Shigeno, Yoshiharu Shirakawabe, Akira Inoue, Osamu Matsuzawa, Naoya Watanabe 2014-10-14
7823470 Cantilever and cantilever manufacturing method Masatsugu Shigeno, Osamu Matsuzawa, Naoya Watanabe, Akira Inoue, Yoshiharu Shirakawabe +2 more 2010-11-02
7456400 Scanning probe microscope and scanning method Masatsugu Shigeno, Yoshiharu Shirakawabe, Osamu Matsuzawa, Naoya Watanabe, Akira Inoue 2008-11-25
7098453 Scanning probe microscopy system and method of measurement by the same Kazunori Ando 2006-08-29