Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9865425 | Sample holder and sample holder set | — | 2018-01-09 |
| 9689893 | Scanning probe microscope | — | 2017-06-27 |
| 8608373 | Softening point measuring apparatus and thermal conductivity measuring apparatus | Masayuki Iwasa, Masatsugu Shigeno, Hiroumi Momota, Kazutoshi Watanabe | 2013-12-17 |
| 7251987 | Scanning probe microscope and measuring method by means of the same | Masafumi Watanabe | 2007-08-07 |
| 7098453 | Scanning probe microscopy system and method of measurement by the same | Amiko Nihei | 2006-08-29 |
| 6941798 | Scanning probe microscope and operation method | Takehiro Yamaoka, Kazutoshi Watanabe, Yoshiharu Shirakawabe | 2005-09-13 |
| 6596992 | Method of operating scanning probe microscope | Kazutoshi Watanabe, Yoshiteru Shikakura, Masaki Tsuchihashi, Takehiro Yamaoka | 2003-07-22 |
| 6476379 | Optoelectronic devices and manufacturing method thereof | Shoichi Takahashi, Hiroshi Naka | 2002-11-05 |
| 6461059 | Photo-electronic device and method of producing the same | Shoichi Takahashi, Hiroshi Naka | 2002-10-08 |
| 6443632 | Photo-electronic device and method of producing the same | Shoichi Takahashi, Hiroshi Naka | 2002-09-03 |