Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391755 | Scanning probe microscope and setting method thereof | Masatsugu Shigeno, Hiroyoshi Yamamoto, Kunihito Higa | 2022-07-19 |
| 10712363 | Scanning probe microscope | Masayuki Iwasa, Shinya Kudo, Toshihiro Ueno | 2020-07-14 |
| 9921241 | Scanning probe microscope and measurement range adjusting method for scanning probe microscope | Masatsugu Shigeno | 2018-03-20 |
| 9354248 | Method for measuring vibration characteristic of cantilever | Masatsugu Shigeno | 2016-05-31 |
| 8615811 | Method of measuring vibration characteristics of cantilever | Masatsugu Shigeno | 2013-12-24 |
| 8495759 | Probe aligning method for probe microscope and probe microscope operated by the same | Shigeru Wakiyama, Hiroyoshi Yamamoto, Itaru Kitajima | 2013-07-23 |
| 8024816 | Approach method for probe and sample in scanning probe microscope | Masato Iyoki, Masafumi Watanabe | 2011-09-20 |
| 7997124 | Scanning probe microscope | Kazutoshi Watanabe | 2011-08-16 |
| 7442925 | Working method using scanning probe | Masatoshi Yasutake, Takuya Nakaue, Kazutoshi Watanabe, Osamu Takaoka, Atsushi Uemoto +1 more | 2008-10-28 |
| 7284415 | Scanning probe microscope | Kazutoshi Watanabe | 2007-10-23 |
| 6596992 | Method of operating scanning probe microscope | Kazunori Ando, Kazutoshi Watanabe, Masaki Tsuchihashi, Takehiro Yamaoka | 2003-07-22 |