Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9766267 | Actuator position calculation device, actuator position calculation method, and actuator position calculation program | Masatsugu Shigeno, Masafumi Watanabe, Kazutoshi Watanabe | 2017-09-19 |
| 8495759 | Probe aligning method for probe microscope and probe microscope operated by the same | Hiroyoshi Yamamoto, Yoshiteru Shikakura, Itaru Kitajima | 2013-07-23 |
| 7945964 | Apparatus structure and scanning probe microscope including apparatus structure | Kenichi Akamatsu | 2011-05-17 |
| 7378654 | Processing probe | Osamu Takaoka, Masatoshi Yasutake | 2008-05-27 |
| 7373806 | Scanning probe microscope and scanning method | Itaru Kitajima, Kazutoshi Watanabe, Masatoshi Yasutake, Akira Inoue | 2008-05-20 |
| 7278299 | Method of processing vertical cross-section using atomic force microscope | Osamu Takaoka, Masatoshi Yasutake, Naoya Watanabe | 2007-10-09 |
| 7259372 | Processing method using probe of scanning probe microscope | Osamu Takaoka, Masatoshi Yasutake, Naoya Watanabe | 2007-08-21 |
| 7232995 | Method of removing particle of photomask using atomic force microscope | Osamu Takaoka, Masatoshi Yasutake, Naoya Watanabe | 2007-06-19 |
| 6388249 | Surface analyzing apparatus | Naohiko Fujino | 2002-05-14 |
| 6355495 | Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof | Naohiko Fujino, Isamu Karino, Masahi Ohmori, Masatoshi Yasutake | 2002-03-12 |
| 6259093 | Surface analyzing apparatus | Naohiko Fujino | 2001-07-10 |
| 6255127 | Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same | Naohiko Fujino, Isamu Karino, Masashi Ohmori, Masatoshi Yasutake | 2001-07-03 |
| 6184519 | Surface analyzing apparatus with anti-vibration table | Naohiko Fujino | 2001-02-06 |
| 6124142 | Method for analyzing minute foreign substance elements | Naohiko Fujino, Isamu Karino, Masashi Ohmori, Masatoshi Yasutake | 2000-09-26 |
| 5877035 | Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same | Naohiko Fujino, Isamu Karino, Masashi Ohmori, Masatoshi Yasutake | 1999-03-02 |
| 5453616 | Probe microscope having error correction piezoelectric scanner | — | 1995-09-26 |
| 5423514 | Alignment assembly for aligning a spring element with a laser beam in a probe microscope | Hiroyoshi Yamamoto, Masatoshi Yasutake | 1995-06-13 |
| 4921346 | Tunnel current detecting photo-acoustic spectrometer | Hiroshi Tokumoto, Hiroshi Bando, Fumiki Sakai, Chikara Miyata | 1990-05-01 |
| 4866271 | Relative displacement control apparatus | Masatoshi Ono, Wataru Mizutani, Hiroshi Murakami, Hiroshi Bando, Fumiki Sakai +1 more | 1989-09-12 |