Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6355495 | Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof | Naohiko Fujino, Masahi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama | 2002-03-12 |
| 6255127 | Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same | Naohiko Fujino, Masashi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama | 2001-07-03 |
| 6124142 | Method for analyzing minute foreign substance elements | Naohiko Fujino, Masashi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama | 2000-09-26 |
| 5877035 | Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same | Naohiko Fujino, Masashi Ohmori, Masatoshi Yasutake, Shigeru Wakiyama | 1999-03-02 |
| 5795919 | Insulating paints | Seiichi Mitumoto, Shigeto Maejima, Takashi Masuda | 1998-08-18 |
| 5715052 | Method of detecting the position and the content of fine foreign matter on substrates and analyzers used therefor | Naohiko Fujino | 1998-02-03 |
| 5517027 | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these | Yoshitsugu Nakagawa, Fusami Soeda, Naohiko Fujino, Osamu Wada, Hiroshi Kurokawa +6 more | 1996-05-14 |