Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8495759 | Probe aligning method for probe microscope and probe microscope operated by the same | Shigeru Wakiyama, Hiroyoshi Yamamoto, Yoshiteru Shikakura | 2013-07-23 |
| 7476418 | Method for fabricating nanometer-scale structure | Masatoshi Yasutake, Takashi Kaito, Yoshiharu Shirakawabe | 2009-01-13 |
| 7373806 | Scanning probe microscope and scanning method | Kazutoshi Watanabe, Shigeru Wakiyama, Masatoshi Yasutake, Akira Inoue | 2008-05-20 |
| 7375322 | Cantilever holder and scanning probe microscope | Masatsugu Shigeno | 2008-05-20 |
| 7026607 | Scanning probe microscope | Masatsugu Shigeno | 2006-04-11 |