MS

Masatsugu Shigeno

SN Sii Nanotechnology: 11 patents #11 of 157Top 8%
HS Hitachi High-Tech Science: 10 patents #14 of 167Top 9%
SI Seiko Instruments: 5 patents #328 of 1,437Top 25%
Overall (All Time): #153,525 of 4,157,543Top 4%
26
Patents All Time

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
11391755 Scanning probe microscope and setting method thereof Hiroyoshi Yamamoto, Yoshiteru Shikakura, Kunihito Higa 2022-07-19
10837982 Scanning probe microscope and scanning method using the same Hiroyoshi Yamamoto, Kazutoshi Watanabe 2020-11-17
10345335 Scanning probe microscope and scanning method thereof Kazutoshi Watanabe, Hiroyoshi Yamamoto 2019-07-09
10161958 Three-dimensional fine movement device Kazutoshi Watanabe, Masafumi Watanabe 2018-12-25
10151773 Scanning probe microscope and probe contact detection method Kazutoshi Watanabe, Masafumi Watanabe, Hiroyoshi Yamamoto, Kazuo Chinone 2018-12-11
9921241 Scanning probe microscope and measurement range adjusting method for scanning probe microscope Yoshiteru Shikakura 2018-03-20
9766267 Actuator position calculation device, actuator position calculation method, and actuator position calculation program Shigeru Wakiyama, Masafumi Watanabe, Kazutoshi Watanabe 2017-09-19
9645170 Scanning probe microscope 2017-05-09
9354248 Method for measuring vibration characteristic of cantilever Yoshiteru Shikakura 2016-05-31
8859279 Cell detachment method Amiko Nihei, Yoshiharu Shirakawabe, Akira Inoue, Osamu Matsuzawa, Naoya Watanabe 2014-10-14
8719959 Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system 2014-05-06
8615811 Method of measuring vibration characteristics of cantilever Yoshiteru Shikakura 2013-12-24
8608373 Softening point measuring apparatus and thermal conductivity measuring apparatus Kazunori Ando, Masayuki Iwasa, Hiroumi Momota, Kazutoshi Watanabe 2013-12-17
8214915 Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever Kazutoshi Watanabe, Masato Iyoki, Naoya Watanabe 2012-07-03
7973942 Optical displacement detection mechanism and surface information measurement device using the same Masato Iyoki, Hiroyoshi Yamamoto, Kazutoshi Watanabe 2011-07-05
7945965 Sensor for observations in liquid environments and observation apparatus for use in liquid environments Naoya Watanabe, Masato Iyoki 2011-05-17
7861577 Electric potential difference detection method and scanning probe microscope Akira Inoue 2011-01-04
7823470 Cantilever and cantilever manufacturing method Osamu Matsuzawa, Naoya Watanabe, Amiko Nihei, Akira Inoue, Yoshiharu Shirakawabe +2 more 2010-11-02
7614288 Scanning probe microscope fine-movement mechanism and scanning probe microscope using same Masato Iyoki 2009-11-10
7605368 Vibration-type cantilever holder and scanning probe microscope Masato Iyoki 2009-10-20
7580125 Liquid cell Akira Inoue 2009-08-25
7456400 Scanning probe microscope and scanning method Yoshiharu Shirakawabe, Amiko Nihei, Osamu Matsuzawa, Naoya Watanabe, Akira Inoue 2008-11-25
7375322 Cantilever holder and scanning probe microscope Itaru Kitajima 2008-05-20
7170054 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder Masato Iyoki 2007-01-30
7026607 Scanning probe microscope Itaru Kitajima 2006-04-11