KC

Kazuo Chinone

SI Seiko Instruments: 8 patents #205 of 1,437Top 15%
HS Hitachi High-Tech Science: 5 patents #34 of 167Top 25%
SN Sii Nanotechnology: 1 patents #82 of 157Top 55%
Overall (All Time): #344,828 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10908104 Radiation analysis apparatus Satoshi Nakayama, Keiichi Tanaka, Atsushi Nagata 2021-02-02
10801977 Radiation analyzing apparatus and radiation analyzing method Atsushi Nagata, Satoshi Nakayama, Keiichi Tanaka 2020-10-13
10151773 Scanning probe microscope and probe contact detection method Masatsugu Shigeno, Kazutoshi Watanabe, Masafumi Watanabe, Hiroyoshi Yamamoto 2018-12-11
10048216 X-ray analyzer Keiichi Tanaka 2018-08-14
10018578 X-ray analysis device Satoshi Nakayama, Keiichi Tanaka, Atsushi Nagata 2018-07-10
6974952 Radiation detector Toshimitsu Morooka, Keiichi Tanaka, Atsushi Nagata, Tatsuji Ishikawa 2005-12-13
6111405 Nondestructive method of quantitatively evaluating degree of plasticity of steel material Hiroshi Yamakawa, Noboru Ishikawa, Satoshi Nakayama, Akikazu Odawara 2000-08-29
6025713 Superconducting quantum interference device and non-destructive evaluation apparatus using the same Toshimitsu Morooka, Satoshi Nakayama, Akikazu Odawara 2000-02-15
5982172 Method of detecting plastic deformation in steel using a differential type magnetic field sensor Noboru Ishikawa, Hiroshi Yamakawa, Satoshi Nakayama, Akikazu Odawara 1999-11-09
5854492 Superconducting quantum interference device fluxmeter and nondestructive inspection apparatus Toshimitsu Morooka, Satoshi Nakayama, Akikazu Odawara 1998-12-29
5834938 Nondestructive inspection apparatus with superconducting magnetic sensor Akikazu Odawara, Satoshi Nakayama 1998-11-10
5825183 Radial differential squid magnetic flux meter Toshimitsu Morooka, Nobuhiro Shimizu 1998-10-20
5825182 Nondestructive testing system using a SQUID Satoshi Nakayama, Akikazu Odawara, Tatsuaki Ataka 1998-10-20
5306521 Process for manufacturing DC superconducting quantum interference device Nobuhiro Shimizu, Norio Chiba 1994-04-26