Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8813261 | Scanning probe microscope | Naokatsu Nosaka, Hiroumi Momota, Junji Kuwahara | 2014-08-19 |
| 8601608 | Cantilever for scanning probe microscope and scanning probe microscope equipped with it | Kenichi Maruyama, Koji Suzuki | 2013-12-03 |
| 8214915 | Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever | Masatsugu Shigeno, Kazutoshi Watanabe, Naoya Watanabe | 2012-07-03 |
| 8161568 | Self displacement sensing cantilever and scanning probe microscope | Naoya Watanabe | 2012-04-17 |
| 8115367 | Piezoelectric actuator provided with a displacement meter, piezoelectric element, and positioning device | — | 2012-02-14 |
| 8058780 | Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those | — | 2011-11-15 |
| 8024816 | Approach method for probe and sample in scanning probe microscope | Yoshiteru Shikakura, Masafumi Watanabe | 2011-09-20 |
| 7973942 | Optical displacement detection mechanism and surface information measurement device using the same | Hiroyoshi Yamamoto, Kazutoshi Watanabe, Masatsugu Shigeno | 2011-07-05 |
| 7945965 | Sensor for observations in liquid environments and observation apparatus for use in liquid environments | Naoya Watanabe, Masatsugu Shigeno | 2011-05-17 |
| 7787133 | Optical displacement-detecting mechanism and probe microscope using the same | Hiroyoshi Yamamoto, Kazutoshi Watanabe | 2010-08-31 |
| 7614287 | Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same | Hiroyoshi Yamamoto | 2009-11-10 |
| 7614288 | Scanning probe microscope fine-movement mechanism and scanning probe microscope using same | Masatsugu Shigeno | 2009-11-10 |
| 7605368 | Vibration-type cantilever holder and scanning probe microscope | Masatsugu Shigeno | 2009-10-20 |
| 7288762 | Fine-adjustment mechanism for scanning probe microscopy | Akihiko Hidaka, Kazutoshi Watanabe | 2007-10-30 |
| 7282157 | Method of manufacturing light-propagating probe for near-field microscope | Norio Chiba, Hiroshi Muramatsu | 2007-10-16 |
| 7241987 | Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe | Yuika Saito, Takashi Murakami, Satoshi Kawata, Yasushi Inoue, Kazuhito Tsukagoshi | 2007-07-10 |
| 7170054 | Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder | Masatsugu Shigeno | 2007-01-30 |
| 6257053 | Scanning probe microscope having piezoelectric member for controlling movement of probe | Eisuke Tomita, Masao Hasegawa | 2001-07-10 |