Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7241987 | Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe | Takashi Murakami, Satoshi Kawata, Yasushi Inoue, Kazuhito Tsukagoshi, Masato Iyoki | 2007-07-10 |