| 6373246 |
Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensor |
Naoto Moriya |
2002-04-16 |
| 6257053 |
Scanning probe microscope having piezoelectric member for controlling movement of probe |
Masato Iyoki, Masao Hasegawa |
2001-07-10 |
| 6249000 |
Scanning probe microscope |
Hiroshi Muramatsu |
2001-06-19 |
| 6201227 |
Scanning probe microscope |
— |
2001-03-13 |
| 6194711 |
Scanning near-field optical microscope |
— |
2001-02-27 |
| 6081113 |
Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material |
Naoto Moriya |
2000-06-27 |
| 5990477 |
Apparatus for machining, recording, and reproducing, using scanning probe microscope |
— |
1999-11-23 |
| 5894122 |
Scanning near field optical microscope |
— |
1999-04-13 |
| 5804708 |
Atomic force microscope and method of analyzing frictions in atomic force microscope |
Kazushi Yamanaka |
1998-09-08 |
| 5623205 |
Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field |
Masatoshi Yasutake |
1997-04-22 |
| 5120959 |
Apparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe therefor |
— |
1992-06-09 |
| 4969978 |
Apparatus and method for tunnel current measurement observed simultaneously with electrochemical measurement |
Toshihiko Sakuhara, Kingo Itaya |
1990-11-13 |