Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6373246 | Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensor | Naoto Moriya | 2002-04-16 |
| 6257053 | Scanning probe microscope having piezoelectric member for controlling movement of probe | Masato Iyoki, Masao Hasegawa | 2001-07-10 |
| 6249000 | Scanning probe microscope | Hiroshi Muramatsu | 2001-06-19 |
| 6201227 | Scanning probe microscope | — | 2001-03-13 |
| 6194711 | Scanning near-field optical microscope | — | 2001-02-27 |
| 6081113 | Cantilever magnetic force sensor for magnetic force microscopy having a magnetic probe coated with a hard-magnetic material | Naoto Moriya | 2000-06-27 |
| 5990477 | Apparatus for machining, recording, and reproducing, using scanning probe microscope | — | 1999-11-23 |
| 5894122 | Scanning near field optical microscope | — | 1999-04-13 |
| 5804708 | Atomic force microscope and method of analyzing frictions in atomic force microscope | Kazushi Yamanaka | 1998-09-08 |
| 5623205 | Method and apparatus for measuring a magnetic field using a magnetic force microscope by magnetizing a probe and correcting a detected magnetic field | Masatoshi Yasutake | 1997-04-22 |
| 5120959 | Apparatus for simultaneously effecting electrochemical measurement and measurement of tunneling current and tunnel probe therefor | — | 1992-06-09 |
| 4969978 | Apparatus and method for tunnel current measurement observed simultaneously with electrochemical measurement | Toshihiko Sakuhara, Kingo Itaya | 1990-11-13 |