Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11982659 | System, method and program for calibrating moisture sensor | Takamitsu IWAYA, Shingo Akao, Tatsuhiro Okano, Nobuo Takeda, Toshihiro Tsuji +4 more | 2024-05-14 |
| 11333631 | System, method and computer program product for measuring gas concentration | Shingo Akao, Nobuo Takeda, Toshihiro Tsuji, Toru Oizumi, Yusuke Tsukahara | 2022-05-17 |
| 11313836 | System, method and computer program product for gas analysis | Nobuo Takeda, Shingo Akao, Toshihiro Tsuji, Toru Oizumi, Hideyuki Fukushi +3 more | 2022-04-26 |
| 11307176 | Standard-moisture generator, system using the standard-moisture generator, method for detecting abnormality in standard-moisture and computer program product for detecting the abnormality | Yusuke Tsukahara, Osamu Hirayama, Nobuo Takeda, Toshihiro Tsuji, Toru Oizumi +4 more | 2022-04-19 |
| 10436757 | Electrical signal processing device | Toshihiro Tsuji, Toru Oizumi | 2019-10-08 |
| 9726709 | Semiconductor chip and method for detecting disconnection of wire bonded to semiconductor chip | Taro Kajiyama | 2017-08-08 |
| 8559696 | Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesion | Yoshikazu Ohara, Yohei Shintaku | 2013-10-15 |
| 8220310 | Gas analyzer and method of gas analysis | Toshihiro Tsuji, Naoya Iwata | 2012-07-17 |
| 8106703 | Booster circuit | Yoshihiro NAGAI, Masakazu Amanai, Masahiko Kashimura, Masato Taki, Norihiro Honda | 2012-01-31 |
| 8004902 | Nonvolatile semiconductor memory device | Masakazu Amanai, Masahiko Kashimura, Yoshihiro NAGAI, Masato Taki, Norihiro Honda | 2011-08-23 |
| 7647814 | Environment difference detector | Noritake Nakaso, Shingo Akao, Dong Sim, Ichitaro Satoh, Tetsuya Miyagishi | 2010-01-19 |
| 7423360 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2008-09-09 |
| 7408285 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2008-08-05 |
| 7368847 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2008-05-06 |
| 7368848 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2008-05-06 |
| 7362034 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2008-04-22 |
| 7247969 | Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device | Noritaka Nakaso | 2007-07-24 |
| 7170213 | Surface acoustic wave element, electric signal processing apparatus using the surface acoustic wave element, environment evaluating apparatus using the electric signal processing apparatus, and analyzing method using the surface acoustic wave element | Noritaka Nakaso, Yusuke Tsukahara | 2007-01-30 |
| 6983644 | Specimen observation method in atomic force microscopy and atomic force microscope | Keiichi Nakamoto | 2006-01-10 |
| 6566787 | Elastic surface-wave device | Yusuke Tsukahara, Noritaka Nakaso | 2003-05-20 |
| 6006593 | Method using cantilever to measure physical properties | — | 1999-12-28 |
| 5804708 | Atomic force microscope and method of analyzing frictions in atomic force microscope | Eisuke Tomita | 1998-09-08 |
| 5503010 | Directional atomic force microscope and method of observing a sample with the microscope | — | 1996-04-02 |
| 5101382 | Acoustic imaging method and apparatus for nondestructive evaluation of materials | — | 1992-03-31 |
| 4825423 | Method of measuring microcrack depth | — | 1989-04-25 |