Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8813261 | Scanning probe microscope | Masato Iyoki, Naokatsu Nosaka, Junji Kuwahara | 2014-08-19 |
| 8621660 | Probe shape evaluation method for a scanning probe microscope | Masafumi Watanabe | 2013-12-31 |
| 8608373 | Softening point measuring apparatus and thermal conductivity measuring apparatus | Kazunori Ando, Masayuki Iwasa, Masatsugu Shigeno, Kazutoshi Watanabe | 2013-12-17 |
| 8584261 | Method of determining a spring constant of a cantilever and scanning probe microscope using the method | Masafumi Watanabe | 2013-11-12 |