TF

Toshiaki Fujii

SN Sii Nanotechnology: 19 patents #2 of 157Top 2%
EC Ebara Research Co.: 10 patents #1 of 45Top 3%
SI Seiko Instruments: 9 patents #182 of 1,437Top 15%
EB Ebara: 9 patents #259 of 1,611Top 20%
HS Hitachi High-Tech Science: 3 patents #52 of 167Top 35%
Honda Motor Co.: 3 patents #6,619 of 21,052Top 35%
NE Nec: 2 patents #5,510 of 14,502Top 40%
JI Japan Atomic Energy Research Institute: 2 patents #81 of 609Top 15%
NU National University Corporation Nagoya University: 2 patents #92 of 782Top 15%
NT NTT: 2 patents #2,095 of 4,871Top 45%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
HA Honda Patents & Technologies North America: 1 patents #24 of 46Top 55%
JE Jeol: 1 patents #309 of 669Top 50%
RO Rorze: 1 patents #21 of 44Top 50%
CH Cci Holdings: 1 patents #11 of 37Top 30%
Overall (All Time): #35,766 of 4,157,543Top 1%
63
Patents All Time

Issued Patents All Time

Showing 26–50 of 63 patents

Patent #TitleCo-InventorsDate
7298729 Radio communication system and destination portable terminal time identification method 2007-11-20
7276691 Ion beam device and ion beam processing method Toshio Kodama, Masakatsu Hasuda, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi 2007-10-02
7095024 TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope Tatsuya Adachi, Masashi Iwatsuki, Mikio Naruse, Mike Hassel Shearer 2006-08-22
7029518 Method and apparatus for the preparation of clean gases Tsukuru Suzuki, Hidetomo Suzuki, Kazuhiko Sakamoto 2006-04-18
7020152 Network system for controlling independent access to stored data among local area networks Toshio Doi, Masashi Muramatsu, Hiroshi Matsumura 2006-03-28
6939859 Skin preparations for external use Hironobu Murase 2005-09-06
6934920 Specimen analyzing method Masamichi Oi, Atsushi Yamauchi 2005-08-23
6911064 Method and apparatus for the preparation of clean gases Tsukuru Suzuki, Hidetomo Suzuki, Kazuhiko Sakamoto 2005-06-28
6870161 Apparatus for processing and observing a sample Tatsuya Adachi, Hiroshi Sawaragi, Yasuhiko Sugiyama 2005-03-22
6838685 Ion beam apparatus, ion beam processing method and sample holder member Toshio Kodama, Masakatsu Hasuda, Kouji Iwasaki, Yasuhiko Sugiyama, Yasuyuki Takagi 2005-01-04
6736354 Airplane fuel supply system and airplane wing pipeline assembly method Kenichi Goto 2004-05-18
6733570 Method and apparatus for the preparation of clean gases Tsukuru Suzuki, Hidetomo Suzuki, Kazuhiko Sakamoto 2004-05-11
6620385 Method and apparatus for purifying a gas containing contaminants 2003-09-16
6489612 Method of measuring film thickness Toshio Kodama, Yasuhiko Sugiyama 2002-12-03
6461692 Chemical vapor deposition method and chemical vapor deposition apparatus Motoaki Adachi, Kikuo Okuyama 2002-10-08
6395240 Carrier box for semiconductor substrate Osamu Horita 2002-05-28
6391118 Method for removing particles from surface of article Kikuo Okuyama, Manabu Shimada 2002-05-21
6384418 Sample transfer apparatus and sample stage Yasuhiko Sugiyama 2002-05-07
6340381 Method and apparatus for the preparation of clean gases Tsukuru Suzuki, Hidetomo Suzuki, Kazuhiko Sakamoto 2002-01-22
6331712 Section formation observing method Yasuhiko Sugiyama 2001-12-18
6300628 Focused ion beam machining method and device thereof Yasuhiko Sugiyama, Toshio Doi 2001-10-09
6240931 Method for removing particles from a surface of an article Kikuo Okuyama, Manabu Shimada 2001-06-05
6205676 Method and apparatus for removing particles from surface of article Kikuo Okuyama, Manabu Shimada 2001-03-27
6159421 Method of cleaning gases 2000-12-12
6146797 Focused ion beam lithography method with sample inspection through oblique angle tilt 2000-11-14