Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7095024 | TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope | Tatsuya Adachi, Toshiaki Fujii, Masashi Iwatsuki, Mikio Naruse | 2006-08-22 |