Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9972705 | Method for manufacturing semiconductor device | — | 2018-05-15 |
| 7095024 | TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscope | Tatsuya Adachi, Toshiaki Fujii, Mikio Naruse, Mike Hassel Shearer | 2006-08-22 |
| 5128544 | Scanning probe microscope | — | 1992-07-07 |
| 4894538 | Scanning device for scanning tunneling microscope | Kimio Ohi, Kazuma SUZUKI, Kiyoshi Miyashita | 1990-01-16 |