Issued Patents All Time
Showing 26–50 of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8405053 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2013-03-26 |
| 8222618 | Method and apparatus for processing a microsample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2012-07-17 |
| 8115184 | Gas field ion source, charged particle microscope, and apparatus | Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Tomihiro Hashizume, Tohru Ishitani | 2012-02-14 |
| 7999240 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2011-08-16 |
| 7989782 | Apparatus and method for specimen fabrication | Miyuki Takahashi, Hiroyasu Shichi, Muneyuki Fukuda | 2011-08-02 |
| 7952083 | Ion beam system and machining method | Hiroyasu Shichi, Muneyuki Fukuda, Yoshinori Nakayama, Masaki Hasegawa | 2011-05-31 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2011-03-01 |
| 7888639 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2011-02-15 |
| 7791050 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2010-09-07 |
| 7725278 | Method for failure analysis and system for failure analysis | Hiroyasu Shichi, Muneyuki Fukuda, Kaoru Umemura | 2010-05-25 |
| 7709062 | Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electronic device | Hiroyasu Shichi, Muneyuki Fukuda, Isamu Sekihara, Kaoru Umemura | 2010-05-04 |
| 7700931 | Ion beam processing apparatus | Hiroyasu Shichi, Noriyuki Kaneoka, Kaoru Umemura, Koji Ishiguro | 2010-04-20 |
| 7696496 | Apparatus for ion beam fabrication | Hiroyasu Shichi, Noriyuki Kaneoka, Kaoru Umemura, Koji Ishiguro | 2010-04-13 |
| 7550750 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2009-06-23 |
| 7525108 | Focused ion beam apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2009-04-28 |
| 7482603 | Apparatus and method for specimen fabrication | Miyuki Takahashi, Hiroyasu Shichi, Muneyuki Fukuda | 2009-01-27 |
| 7470918 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2008-12-30 |
| 7465945 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2008-12-16 |
| 7397050 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7397051 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7397052 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2008-07-08 |
| 7372050 | Method of preventing charging, and apparatus for charged particle beam using the same | Muneyuki Fukuda, Hiroyasu Shichi | 2008-05-13 |
| 7326942 | Ion beam system and machining method | Hiroyasu Shichi, Muneyuki Fukuda, Yoshinori Nakayama, Masaki Hasegawa | 2008-02-05 |
| 7301146 | Probe driving method, and probe apparatus | Hidemi Koike, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2007-11-27 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2007-09-11 |