Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10217602 | Charged particle beam apparatus and aberration corrector | — | 2019-02-26 |
| 9484182 | Charged-particle-beam device and method for correcting aberration | Hisanao Akima | 2016-11-01 |
| 9224574 | Charged particle optical equipment and method for measuring lens aberration | Hisanao Akima | 2015-12-29 |
| 8866078 | Scanning transmission type electron microscope | Hisanao Akima | 2014-10-21 |
| 8035086 | Aberration correction apparatus that corrects spherical aberration of charged particle apparatus | Yoichi Hirayama | 2011-10-11 |
| 7825377 | Electron beam apparatus with aberration corrector | Takeshi Kawasaki, Yoichi Ose, Hideo Todokoro | 2010-11-02 |
| 7732766 | Method for measuring information transfer limit in transmission electron microscope, and transmission electron microscope using the same | — | 2010-06-08 |
| 7619218 | Charged particle optical apparatus with aberration corrector | Tomonori Nakano | 2009-11-17 |
| 7531799 | Charged particle beam column | Takeshi Kawasaki, Tomonori Nakano | 2009-05-12 |
| 7375323 | Electron beam apparatus with aberration corrector | Takeshi Kawasaki, Yoichi Ose, Hideo Todokoro | 2008-05-20 |
| 7319225 | Transmission electron microscope | Hiroto Kasai | 2008-01-15 |
| 7223983 | Charged particle beam column | Takeshi Kawasaki, Tomonori Nakano | 2007-05-29 |
| 7211804 | Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the corrector | Takeshi Kawasaki | 2007-05-01 |
| 7199365 | Electron beam apparatus with aberration corrector | Takeshi Kawasaki, Yoichi Ose, Hideo Todokoro | 2007-04-03 |
| 6982427 | Electron beam apparatus with aberration corrector | Takeshi Kawasaki, Yoichi Ose, Hideo Todokoro | 2006-01-03 |