KN

Kuniyasu Nakamura

HH Hitachi High-Technologies: 9 patents #352 of 1,917Top 20%
HI Hitachi: 7 patents #5,859 of 28,497Top 25%
Overall (All Time): #315,531 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
11756764 Charged particle beam apparatus and method of controlling charged particle beam apparatus Takashi Dobashi, Hirokazu Tamaki, Hiromi Mise 2023-09-12
9293293 Electron gun and charged particle beam device having an aperture with flare-suppressing coating Shun-ichi Watanabe, Takashi Onishi, Yoichi Ose, Masaru Moriyama, Tomonori Suzuki 2016-03-22
8878130 Scanning electron microscope and scanning transmission electron microscope Hiromi Inada 2014-11-04
8710438 Scanning transmission electron microscope and axial adjustment method thereof Hiromi Inada 2014-04-29
D571385 Electron microscope Mitsuru Onuma, Koichirou Saito, Takahito Hashimoto, Hiromi Inada 2008-06-17
7372029 Scanning transmission electron microscope and scanning transmission electron microscopy Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto 2008-05-13
7285776 Scanning transmission electron microscope and electron energy loss spectroscopy Shunichi Watanabe 2007-10-23
7227144 Scanning transmission electron microscope and scanning transmission electron microscopy Ruriko Tsuneta, Masanari Koguchi, Takahito Hashimoto 2007-06-05
6875984 Bio electron microscope and observation method of specimen Hiroshi Kakibayashi, Shigeyuki Hosoki, Yuji Takagi, Ryo Miyake, Mitsugu Sato +1 more 2005-04-05
6822233 Method and apparatus for scanning transmission electron microscopy Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto 2004-11-23
6750451 Observation apparatus and observation method using an electron beam Masanari Koguchi, Kaoru Umemura, Yoshifumi Taniguchi, Mikio Ichihashi 2004-06-15
6548811 Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope Hiroshi Kakibayashi 2003-04-15
6531697 Method and apparatus for scanning transmission electron microscopy Hiroshi Kakibayashi, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto 2003-03-11
6051834 Electron microscope Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi +7 more 2000-04-18
5866905 Electron microscope Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi +7 more 1999-02-02