Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7145146 | Micro-spectroscopic measuring device and micro-chemical system | Taro Ogawa, Toshiki Sugawara, Kazuhiko Hosomi, Masataka Shirai, Toshio Katsuyama +3 more | 2006-12-05 |
| 7034299 | Transmission electron microscope system and method of inspecting a specimen using the same | Ryo Nakagaki, Yuji Takagi, Hirohito Okuda | 2006-04-25 |
| 6875984 | Bio electron microscope and observation method of specimen | Shigeyuki Hosoki, Yuji Takagi, Ryo Miyake, Kuniyasu Nakamura, Mitsugu Sato +1 more | 2005-04-05 |
| 6822233 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto | 2004-11-23 |
| 6548811 | Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope | Kuniyasu Nakamura | 2003-04-15 |
| 6531697 | Method and apparatus for scanning transmission electron microscopy | Kuniyasu Nakamura, Mikio Ichihashi, Shigeto Isakozawa, Yuji Sato, Takahito Hashimoto | 2003-03-11 |
| 6051834 | Electron microscope | Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 2000-04-18 |
| 5932880 | Scintillator device and image pickup apparatus using the same | Masanari Koguchi, Tetsuya Ooshima, Kenji Sameshima, Tatsuo Makishima, Keiichi Kanehori +1 more | 1999-08-03 |
| 5866905 | Electron microscope | Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +7 more | 1999-02-02 |
| 5744800 | Defect observing electron microscope | Hisaya Murakoshi, Hidekazu Okuhira, Takashi Irie, Jiro Tokita, Keiichi Kanehori +1 more | 1998-04-28 |
| 5717207 | Transmission electron microscope with camera system | Masanari Koguchi, Hiroyuki Tanaka, Shigeto Isakozawa, Keiichi Kanehori, Tatsuo Makishima +1 more | 1998-02-10 |
| 5650621 | Electron microscope | Ruriko Tsuneta | 1997-07-22 |
| 5552602 | Electron microscope | Yasuhiro Mitsui, Hideo Tadokoro, Katsuhiro Kuroda, Masanari Koguchi, Kazutaka Tsuji +3 more | 1996-09-03 |
| 5475218 | Instrument and method for 3-dimensional atomic arrangement observation | Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda | 1995-12-12 |
| 5453617 | Electron microscope for specimen composition and strain analysis and observation method thereof | Ruriko Tsuneta | 1995-09-26 |
| 5362972 | Semiconductor device using whiskers | Masamitsu Yazawa, Kenji Hiruma, Toshio Katsuyama, Nobutaka Futigami, Hidetoshi Matsumoto +3 more | 1994-11-08 |
| 5332910 | Semiconductor optical device with nanowhiskers | Keiichi Haraguchi, Kenji Hiruma, Kensuke Ogawa, Toshio Katsuyama, Ken Yamaguchi +4 more | 1994-07-26 |
| 5278408 | Instrument and method for 3-dimensional atomic arrangement observation | Yasuhiro Mitsui, Hideo Todokoro, Katsuhiro Kuroda | 1994-01-11 |