Issued Patents All Time
Showing 51–71 of 71 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6787772 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Mitsugu Sato | 2004-09-07 |
| 6667476 | Scanning electron microscope | Hideo Todokoro, Shou Takami, Makoto Ezumi, Osamu Yamada, Tomohiro Kudo | 2003-12-23 |
| 6646262 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Naomasa Suzuki | 2003-11-11 |
| 6555819 | Scanning electron microscope | Naomasa Suzuki, Toshiro Kubo, Noriaki Arai, Mitsugu Sato, Hideo Todokoro | 2003-04-29 |
| 6501077 | Scanning electron microscope | Tetsuya Sawahata, Mitsugu Sato | 2002-12-31 |
| 6140641 | Ion-trap mass analyzing apparatus and ion trap mass analyzing method | Kiyomi Yoshinari, Yoshiaki Kato, Katsuhiro Nakagawa | 2000-10-31 |
| 6121610 | Ion trap mass spectrometer | Kiyomi Yoshinari, Yoshiaki Kato | 2000-09-19 |
| 6043491 | Scanning electron microscope | Kiyomi Yoshinari, Hideo Todokoro, Mitsugu Sato | 2000-03-28 |
| 5894124 | Scanning electron microscope and its analogous device | Yuko Iwabuchi, Mitsugu Sato | 1999-04-13 |
| 5756993 | Mass spectrometer | Kiyomi Yoshinari, Katsuhiro Nakagawa, Yoshiaki Kato | 1998-05-26 |
| 5677530 | Scanning electron microscope | Mitsugu Sato, Ryuji Hoya | 1997-10-14 |
| 5668368 | Apparatus for suppressing electrification of sample in charged beam irradiation apparatus | Katsuhiko Sakai, Osamu Nasu | 1997-09-16 |
| 5668372 | Scanning electron microscope and its analogous device | Yuko Iwabuchi, Mitsugu Sato | 1997-09-16 |
| 5633496 | Mass spectrometry apparatus | Minoru Sakairi, Tadao Mimura, Atsumu Hirabayashi, Yasuaki Takada | 1997-05-27 |
| 5623144 | Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby | Kiyomi Yoshinari, Yoshiaki Kato | 1997-04-22 |
| 5608218 | Scanning electron microscope | Mitsugu Sato, Satoru Fukuhara, Hideo Todokoro, Makoto Ezumi | 1997-03-04 |
| 5576538 | Apparatus and method for ion beam neutralization | Katsuhiko Sakai, Osamu Nasu | 1996-11-19 |
| 5532483 | Mass spectrometer and ion source | Kiyomi Yoshinari, Masayoshi Yano, Tadao Mimura | 1996-07-02 |
| 5466929 | Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus | Katsuhiko Sakai, Osamu Nasu | 1995-11-14 |
| 5095208 | Charged particle generating device and focusing lens therefor | Hiroki Sano, Yoshiya Higuchi, Kazuyoshi Miki | 1992-03-10 |
| 5089699 | Secondary charged particle analyzing apparatus and secondary charged particle extracting section | Yoshiya Higuchi, Kazuyoshi Miki | 1992-02-18 |