Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393509 | Pattern height measurement device and charged particle beam device | Hiroki Kawada, Katsuhiro Sasada, Takenori Hirose | 2019-08-27 |
| 10101150 | Height measurement device and charged particle beam device | Hiroki Kawada, Muneyuki Fukuda, Yoshinori Momonoi | 2018-10-16 |
| 6872944 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2005-03-29 |
| 6667476 | Scanning electron microscope | Hideo Todokoro, Makoto Ezumi, Osamu Yamada, Yoichi Ose, Tomohiro Kudo | 2003-12-23 |