Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10784074 | Charged particle beam apparatus and control method thereof | Takeshi Sunaoshi, Yoshihisa Orai, Takashi Mizuo | 2020-09-22 |
| 10269533 | Anti-contamination trap, and vacuum application device | Takashi Mizuo, Yusuke Tamba, Kazutaka Nimura | 2019-04-23 |
| 9159530 | Electron microscope sample holder and sample observation method | Kotaro Hosoya, Masaomi Ohno | 2015-10-13 |
| 8921784 | Scanning electron microscope | Toru Iwaya, Sakae Kobori, Tomohisa Ohtaki | 2014-12-30 |
| 8766184 | Scanning electron microscope | Hiroyuki Suzuki, Yoshihiko Nakayama | 2014-07-01 |