Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269533 | Anti-contamination trap, and vacuum application device | Takashi Mizuo, Yusuke Tamba, Haruhiko Hatano | 2019-04-23 |
| 10204761 | Charged particle beam device, electron microscope and sample observation method | Takeshi Sunaoshi, Yasuhira Nagakubo | 2019-02-12 |
| 7800059 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2010-09-21 |
| 7361894 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2008-04-22 |
| 7164126 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2007-01-16 |
| 7034296 | Method of forming a sample image and charged particle beam apparatus | Mitsugu Sato, Atsushi Takane, Takashi Iizumi, Tadashi Otaka, Hideo Todokoro +1 more | 2006-04-25 |
| 6963067 | Scanning electron microscope and sample observing method using it | Shuichi Takeuchi, Mine Nakagawa, Mitsugu Sato, Atsushi Takane | 2005-11-08 |