Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10269536 | Electron microscope | Satoshi Takada, Naomasa Suzuki, Kazuo Aoki, Takayuki Hoshino | 2019-04-23 |
| 9766401 | Defect review apparatus and method for correcting coordinate misalignment using two light sources | — | 2017-09-19 |
| 7995833 | Method of alignment for efficient defect review | Hiroshi Miyai | 2011-08-09 |
| 7294833 | Method of alignment for efficient defect review | Hiroshi Miyai | 2007-11-13 |
| 7081625 | Charged particle beam apparatus | Masanari Furiki, Kouichi Kurosawa, Ryuichi Funatsu | 2006-07-25 |
| 5309106 | Magnetic field generator | Goh Miyajima, Takao Takahashi | 1994-05-03 |