Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10724856 | Image analysis apparatus and charged particle beam apparatus | Kazuhisa Hasumi, Hitoshi Namai | 2020-07-28 |
| 10672119 | Inspection device | Masami Ikota, Kazuhisa Hasumi | 2020-06-02 |
| 9824938 | Charged particle beam device and inspection device | Osamu Inoue, Hiroki Kawada | 2017-11-21 |
| 9658063 | Method and device for line pattern shape evaluation | Hiroki Kawada | 2017-05-23 |
| 9421955 | Suspension structure for irregular ground traveling vehicle | Naoki Kuwabara, Akio Handa | 2016-08-23 |
| 9183622 | Image processing apparatus | Yasutaka Toyoda, Norio Hasegawa, Ryoichi Matsuoka | 2015-11-10 |
| 9123504 | Semiconductor inspection device and semiconductor inspection method using the same | Yoshinori Momonoi, Junichi Tanaka, Hiroki Kawada | 2015-09-01 |
| 9000366 | Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns | Yasunari Sohda, Tatsuya Maeda, Osamu Nasu, Hiroki Kawada | 2015-04-07 |
| 8401273 | Apparatus for evaluating degradation of pattern features | Yoshinori Momonoi, Taro Osabe | 2013-03-19 |
| 8369602 | Length measurement system | Jiro Yamamoto, Hiroki Kawada | 2013-02-05 |
| 8300919 | Apparatus for data analysis | Hiroki Kawada | 2012-10-30 |
| 7684937 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication | Hiroshi Fukuda, Hiroki Kawada, Tatsuya Maeda | 2010-03-23 |
| 7619751 | High-accuracy pattern shape evaluating method and apparatus | Hiroshi Fukuda, Osamu Komuro, Hiroki Kawada | 2009-11-17 |
| 7451857 | Seat mount structure for saddle ride type vehicle | Yosuke Hasegawa, Makoto Toda, Yuji Maki, Masahiro Inoue, Hiroaki Tomita +1 more | 2008-11-18 |
| 7405835 | High-accuracy pattern shape evaluating method and apparatus | Hiroshi Fukuda, Osamu Komuro, Hiroki Kawada | 2008-07-29 |
| 7369703 | Method and apparatus for circuit pattern inspection | Tsuneo Terasawa, Tadashi Otaka, Takashi Iizumi, Osamu Komuro | 2008-05-06 |
| 7366620 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication | Hiroshi Fukuda, Hiroki Kawada, Tatsuya Maeda | 2008-04-29 |
| 7290838 | Vehicle wheel | Akio Handa, Yuji Maki, Takashi Nishizaka, Shoji Suzuki, Kiyoshi Amaki +1 more | 2007-11-06 |
| 7230723 | High-accuracy pattern shape evaluating method and apparatus | Hiroshi Fukuda, Osamu Komuro, Hiroki Kawada | 2007-06-12 |
| 7095884 | Method and apparatus for circuit pattern inspection | Tsuneo Terasawa, Tadashi Otaka, Takashi Iizumi, Osamu Komuro | 2006-08-22 |
| 7049589 | Pattern inspection method | Hiroshi Fukuda, Ryuta Tsuchiya, Hiroki Kawada, Shozo Yoneda | 2006-05-23 |
| 6745183 | Document retrieval assisting method and system for the same and document retrieval service using the same | Shingo Nishioka, Makoto Iwayama, Kazuhiro Ono, Akihiko Takano, Yoshiki Niwa | 2004-06-01 |
| 6654738 | Computer program embodied on a computer-readable medium for a document retrieval service that retrieves documents with a retrieval service agent computer | Shingo Nishioka, Makoto Iwayama, Kazuhiro Ono, Akihiko Takano, Yoshiki Niwa | 2003-11-25 |
| 6644756 | Wheel structure | Akio Handa, Hideo Yanai, Bunzo Seki | 2003-11-11 |
| 6457004 | Document retrieval assisting method, system and service using closely displayed areas for titles and topics | Shingo Nishioka, Makoto Iwayama, Kazuhiro Ono, Akihiko Takano, Yoshiki Niwa | 2002-09-24 |