Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11961704 | Charged particle beam system | Naoki Akimoto, Takashi Doi | 2024-04-16 |
| 10770266 | Charged particle beam device and capturing condition adjusting method in charged particle beam device | Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Minoru Yamazaki | 2020-09-08 |
| 10566172 | Charged particle beam apparatus and method for adjusting imaging conditions for the same | Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Minoru Yamazaki | 2020-02-18 |
| 9000365 | Pattern measuring apparatus and computer program | Maki Tanaka, Miki Isawa, Satoru Yamaguchi | 2015-04-07 |
| 8907279 | Electron microscope and image capturing method using electron beam | Natsuki Tsuno, Hideyuki Kazumi, Takafumi Miwa, Yoshinobu Kimura, Toshiyuki Yokosuka | 2014-12-09 |