TS

Takuma Shibahara

HI Hitachi: 14 patents #2,889 of 28,497Top 15%
HH Hitachi High-Technologies: 3 patents #776 of 1,917Top 45%
AZ Azbil: 1 patents #130 of 257Top 55%
NU National University Corporation Tohoku University: 1 patents #86 of 170Top 55%
Overall (All Time): #243,946 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
12210975 Data analysis apparatus, data analysis method, and recording medium 2025-01-28
11907871 Generation device, generation method, and recording medium Yasuho YAMASHITA, Junichi Kuwata 2024-02-20
11636358 Data analysis apparatus, data analysis method, and data analysis program Mayumi Suzuki, Yasuho YAMASHITA 2023-04-25
11568213 Analyzing apparatus, analysis method and analysis program Yasuho YAMASHITA, Mayumi Suzuki 2023-01-31
11527325 Analysis apparatus and analysis method Wataru Takeuchi, Ken Naono, Shinji TARUMI, Shuntaro YUI 2022-12-13
11526722 Data analysis apparatus, data analysis method, and data analysis program Mayumi Suzuki, Ken Naono 2022-12-13
11138515 Data analysis device, data analysis method, and recording medium 2021-10-05
10936971 Optimization apparatus and optimization method for hyper parameter Mayumi Suzuki 2021-03-02
10433815 Ultrasound diagnostic image generating device and method Yoshimi NOGUCHI, Masahiro Ogino, Toshinori Maeda, Yuuko Nagase, Masaru Murashita 2019-10-08
10347035 Diagnostic image generation apparatus and diagnostic image generation method Masahiro Ogino, Yoshimi NOGUCHI 2019-07-09
9830735 Medical image processing device and image processing method Takafumi Koike 2017-11-28
9761041 Diagnostic image generation apparatus and diagnostic image generation method Masahiro Ogino, Yoshimi NOGUCHI 2017-09-12
9589344 Volume data analysis system and method therefor Takafumi Koike 2017-03-07
9336587 Semiconductor circuit pattern measuring apparatus and method Michio Oikawa, Kei Sakai, Satoru Yamaguchi 2016-05-10
8959461 Pattern measurement device and pattern measurement method Michio Oikawa, Yutaka Hojo, Hitoshi Sugahara, Hiroyuki Shindo 2015-02-17
8942464 Pattern measuring apparatus, and pattern measuring method and program Tsuyoshi Minakawa, Michio Oikawa, Yutaka Hojo, Hitoshi Sugahara, Hiroyuki Shindo 2015-01-27
8401278 Image processing apparatus and image processing method Kei Utsugi, Takafumi Koike 2013-03-19
8355564 Corresponding point searching method and three-dimensional position measuring method Takafumi Aoki, Hiroshi Nakajima, Koji Kobayashi, Atsushi Katsumata 2013-01-15