TM

Tsuyoshi Minakawa

HI Hitachi: 9 patents #4,653 of 28,497Top 20%
HH Hitachi High-Technologies: 6 patents #452 of 1,917Top 25%
HD Hitachi Displays: 1 patents #519 of 752Top 70%
HS Hitachi Rail Sts S.P.A.: 1 patents #3 of 34Top 9%
Overall (All Time): #228,958 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
12393897 Service plan change assistance apparatus, decision model creation apparatus, decision model creation program, and train traffic management system Yuki MAEKAWA, Ryota Uematsu, Yuko Yamashita, Yumiko ISHIDO, Yuichi Kobayashi 2025-08-19
12307395 Timetable planning system and timetable generating method Yuki MAEKAWA, Ryota Sato, Ryota Uematsu, Tomoe TOMIYAMA 2025-05-20
12280813 Train operation support system and train operation support method Ryota Uematsu, Yuki MAEKAWA 2025-04-22
12254428 Timetable creation apparatus, timetable creation method, and automatic vehicle control system Keiji Kimura, Michi Kariatsumari, Masahito Kokubo, Megumi YAMAGUCHI 2025-03-18
11803930 Timetable modification device and automatic train control system Keiji Kimura, Tatsuhiro SATOU, Michi Kariatsumari, Claudio Giorgianni 2023-10-31
11754404 Transport navigation system and transport navigation method Ryota Uematsu, Keiji Kimura, Miki YONEHARA 2023-09-12
11710087 Replanned plan output device Akiko Kato 2023-07-25
11188567 Data analysis support apparatus and data analysis support system Yuko Yamashita, Tomoe TOMIYAMA, Kenji Kawasaki, Hidenori Yamamoto, Takeshi Handa +2 more 2021-11-30
10317203 Dimension measuring apparatus and computer readable medium Yasutaka Toyoda 2019-06-11
10223784 Pattern evaluation device and visual inspection device comprising pattern evaluation device Hiroyuki Ushiba 2019-03-05
9858659 Pattern inspecting and measuring device and program Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto, Hiroyuki Shindo +3 more 2018-01-02
9830705 Image evaluation apparatus and pattern shape evaluation apparatus Shinichi Shinoda, Yasutaka Toyoda, Ryoichi Matsuoka 2017-11-28
8953868 Defect inspection method and defect inspection apparatus Shinya Murakami, Chie Shishido, Takashi Hiroi, Taku Ninomiya, Atsushi Miyamoto 2015-02-10
8942464 Pattern measuring apparatus, and pattern measuring method and program Takuma Shibahara, Michio Oikawa, Yutaka Hojo, Hitoshi Sugahara, Hiroyuki Shindo 2015-01-27
8724922 Image correcting device, method for creating corrected image, correction table creating device, method for creating correction table, program for creating correction table, and program for creating corrected image Tatsuzo Hamada 2014-05-13
8630506 Image correcting device, method for creating corrected image, correction table creating device, method for creating correction table, program for creating correction table, and program for creating corrected image Tatsuzo Hamada 2014-01-14
8571345 Method and device for correcting image, and method and device for generating correction table for use in correction of image Tatsuzo Hamada 2013-10-29
7990415 Image input device and calibration method Kosei Matsumoto, Toshio Moriya 2011-08-02
7583307 Autostereoscopic display Michio Oikawa, Takafumi Koike, Masami Yamasaki, Hideyuki Sakai 2009-09-01