Issued Patents All Time
Showing 1–25 of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394038 | Image processing program, image processing device, and image processing method | Masanori OUCHI, Shinichi Shinoda, Yasutaka Toyoda, Ryou YUMIBA | 2025-08-19 |
| 12211194 | Defect inspection with images of different synthesis ratios | Yasushi Ebizuka, Ryugo KAGETANI | 2025-01-28 |
| 12125176 | Inspection apparatus and measurement apparatus | Kosuke FUKUDA, Masayoshi Ishikawa, Yasuhiro Yoshida | 2024-10-22 |
| 12014530 | Image recognition device and method | Ryou YUMIBA, Yasutaka Toyoda | 2024-06-18 |
| 11836906 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Yasutaka Toyoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hitoshi Sugahara | 2023-12-05 |
| 11587225 | Pattern inspection system | Shuyang DOU, Shinichi Shinoda, Yasutaka Toyoda | 2023-02-21 |
| 11448663 | Pattern height information correction system and pattern height information correction method | Kenji Yamasaki, Taeko Kashiwa, Ryugo KAGETANI | 2022-09-20 |
| 11176405 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Yasutaka Toyoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hitoshi Sugahara | 2021-11-16 |
| 11132788 | Pattern inspection system | Shuyang DOU, Shinichi Shinoda, Yasutaka Toyoda | 2021-09-28 |
| 10989794 | Scanning optical system and radar | Ryouta Ishikawa, Hiroyuki Matsuda, Masashi Kageyama, Junichiro Yonetake, Hideyuki Fujii | 2021-04-27 |
| 10937146 | Image evaluation method and image evaluation device | Shinichi Shinoda, Masayoshi Ishikawa, Yasutaka Toyoda, Yuichi Abe | 2021-03-02 |
| 10718611 | Semiconductor evaluation device and computer program | Asuka Honda | 2020-07-21 |
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo +1 more | 2019-10-15 |
| 10078132 | Scanning optical system and radar | Ryouta Ishikawa, Hiroyuki Matsuda, Masashi Kageyama, Junichiro Yonetake, Hideyuki Fujii | 2018-09-18 |
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo +1 more | 2018-06-05 |
| 9869856 | Illumination device and projector | Nozomu Inoue, Akira Miyamae, Shigehiro Yanase | 2018-01-16 |
| 9858659 | Pattern inspecting and measuring device and program | Tsuyoshi Minakawa, Takashi Hiroi, Takeyuki Yoshida, Taku Ninomiya, Takuma Yamamoto +3 more | 2018-01-02 |
| 9846931 | Pattern sensing device and semiconductor sensing system | Yasutaka Toyoda, Yoshihiro Ota | 2017-12-19 |
| 9816958 | Gas sensor, NOx sensor and method of manufacturing gas sensor | Hiroki Fujita | 2017-11-14 |
| 9755191 | Method and apparatus for manufacturing organic electroluminescent element, and organic electroluminescent module | Kuniaki Uezawa, Masahiro Morikawa | 2017-09-05 |
| 9679371 | Pattern shape evaluation device and method | — | 2017-06-13 |
| 9570685 | Method for forming pattern of organic electroluminescent element | Masahiro Morikawa | 2017-02-14 |
| 9536170 | Measurement method, image processing device, and charged particle beam apparatus | Takeyoshi Ohashi, Junichi Tanaka, Yutaka Hojo, Hiroki Kawada | 2017-01-03 |
| 9165214 | Image processing device and computer program | Yuichi Abe | 2015-10-20 |
| 8959461 | Pattern measurement device and pattern measurement method | Takuma Shibahara, Michio Oikawa, Yutaka Hojo, Hitoshi Sugahara | 2015-02-17 |