Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211194 | Defect inspection with images of different synthesis ratios | Hiroyuki Shindo, Ryugo KAGETANI | 2025-01-28 |
| 11791124 | Charged particle beam apparatus | Yuta Kawamoto, Akira Ikegami, Nobuo FUJINAGA | 2023-10-17 |
| 11784023 | Charged particle beam apparatus | Yuta Kawamoto, Akira Ikegami, Nobuo FUJINAGA | 2023-10-10 |
| 11239042 | Beam irradiation device | Akira Ikegami, Yuta Kawamoto, Naomasa Suzuki, Manabu Yano, Naoma Ban | 2022-02-01 |
| 11056310 | Charged-particle beam device | Yuta Kawamoto, Akira Ikegami, Naoma Ban | 2021-07-06 |
| 10832886 | Beam irradiation device | Akira Ikegami, Yuta Kawamoto, Naomasa Suzuki, Manabu Yano, Naoma Ban | 2020-11-10 |
| 9799486 | Charged particle beam apparatus for measuring surface potential of a sample | Seiichiro Kanno, Go Miya, Takafumi Miwa | 2017-10-24 |
| 9543113 | Charged-particle beam device for irradiating a charged particle beam on a sample | Seiichiro Kanno, Naoya Ishigaki, Masashi Fujita | 2017-01-10 |
| 9401297 | Electrostatic chuck mechanism and charged particle beam apparatus | Seiichiro Kanno, Masaya Yasukochi, Masakazu Takahashi, Naoya Ishigaki, Go Miya | 2016-07-26 |
| 9245710 | Charged particle beam device | Kazuhiro Gunji, Yuta Asaga | 2016-01-26 |
| 9105446 | Charged particle beam apparatus | Seiichiro Kanno, Makoto Nishihara, Masashi Fujita | 2015-08-11 |
| 8933422 | Charged particle beam device | Ryoichi Ishii, Takashi Doi, Osamu Sato | 2015-01-13 |