Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12170184 | Transmission electron microscope and inspection method using transmission electron microscope | Toshie Yaguchi, Keiji Tamura, Hiromi Mise, Akiko Wakui, Keisuke Igarashi | 2024-12-17 |