Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8604429 | Electron beam device and sample holding device for electron beam device | Toshie Yaguchi, Yasuhira Nagakubo, Akira Watabe | 2013-12-10 |
| 7622714 | Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus | Toshie Yaguchi, Yoshifumi Taniguchi | 2009-11-24 |
| 7612337 | Focused ion beam system and a method of sample preparation and observation | Yuya Suzuki, Toshie Yaguchi, Mitsuru Konno, Tsuyoshi Ohnishi | 2009-11-03 |
| 6992286 | Material characterization system | Toshie Yaguchi, Yoshifumi Taniguchi | 2006-01-31 |
| 6495838 | Sample heating holder, method of observing a sample and charged particle beam apparatus | Toshie Yaguchi, Masahiro Tomita, Kishio Hidaka | 2002-12-17 |
| 5898177 | Electron microscope | Kishio Hidaka, Toshie Yaguchi, Katsuhisa Usami, Takashi Aoyama, Shigeyoshi Nakamura +2 more | 1999-04-27 |
| 5296669 | Specimen heating device for use with an electron microscope | Hiroyuki Kobayashi, Masahiro Tomita | 1994-03-22 |