Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10535497 | Electron microscope and imaging method | Hirokazu Tamaki, Ken Harada, Keiji Tamura, Yoshifumi Taniguchi, Hiroto Kasai +1 more | 2020-01-14 |
| 9754762 | Electron microscope and sample observation method | Toshie Yaguchi, Hiroyuki Kobayashi | 2017-09-05 |
| 9754763 | Electron microscope | Toshiyuki Oyagi | 2017-09-05 |
| 7863564 | Electric charged particle beam microscope and microscopy | Ruriko Tsuneta, Hideki Kikuchi, Toshie Yaguchi | 2011-01-04 |
| 6777679 | Method of observing a sample by a transmission electron microscope | Isao Nagaoki, Hiroyuki Kobayashi, Toshiyuki Ohyagi | 2004-08-17 |
| 6472663 | Electron microscope | Isao Nagaoki, Hiroyuki Kobayashi | 2002-10-29 |