Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electron microscope and sample observation method using the same

Electron microscope and sample observation method using the same

US Patent 11551907 · Granted Jan 10, 2023

Estimated economic value: $602,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Assembly method using assembly tool2023
Cleaning liquid, cleaning method, and method for producing semiconductor wafer2023
Shape correction device for frame body, and method for manufacturing electrolyte2023
Cleaning liquid, cleaning method, and method for producing semiconductor wafer2021
Cleaning agent composition for semiconductor device substrate, method of cleanin2021
Holography reconstruction method and program2021
Holography reconstruction method and program2021
Interferometric electron microscope2021
Particle beam device, observation method, and diffraction grating2021
Particle beam device, observation method, and diffraction grating2021
Interference optical system unit, charged particle beam interference apparatus, 2020
Interference optical system unit, charged particle beam interference apparatus, 2020