Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo +1 more | 2019-10-15 |
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Hitoshi Sugahara, Yutaka Hojo +1 more | 2018-06-05 |